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    Home»Tech Analysis»Configuring and controlling complex test equipment setups for silicon device test and characterization
    Tech Analysis

    Configuring and controlling complex test equipment setups for silicon device test and characterization

    Editor Times FeaturedBy Editor Times FeaturedSeptember 27, 2025No Comments1 Min Read
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    On this webinar, we are going to discover environment friendly, correct, and scalable strategies for analog and mixed-signal machine testing utilizing reconfigurable check setups. As semiconductor units develop extra advanced, engineers face the problem of validating efficiency and catching edge instances below tight schedules. Check setups usually embody oscilloscopes, waveform mills, community analyzers, and extra, probably from totally different distributors with distinctive automation and configuration issues. With a purpose to maintain tempo with semiconductor validation necessities, multi-channel check setups designed for flexibility and efficiency may also help engineers scale successfully.

    Key learnings:

    • Lowering sign path complexity with a number of built-in devices
    • Bettering knowledge constancy when measuring mixed-signal DUT response
    • Constructing environment friendly parallel check setups to extend throughput
    • Configuring instance check setups for widespread semiconductor validation exams



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